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Volumn 557, Issue , 1999, Pages 677-682

Optical filter for fabricating self-aligned amorphous Si TFTS

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; CAPACITANCE; ELECTRIC CONTACTS; ELECTRONIC STRUCTURE; EXCIMER LASERS; GATES (TRANSISTOR); LIGHT TRANSMISSION; LITHOGRAPHY; OPTICAL FILTERS; RADIATION DAMAGE; SEMICONDUCTOR DOPING; SUBSTRATES;

EID: 0033300313     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-557-677     Document Type: Article
Times cited : (5)

References (12)
  • 4
    • 0014615843 scopus 로고
    • D. L. Kkendall and D. B. DeVries, Diffusion in Silicon., R. R. Haberecht and E. L. Kern, Eds., Electrochemical Society, New York,.
    • D. L. Kkendall and D. B. DeVries, Diffusion in Silicon., R. R. Haberecht and E. L. Kern, Eds., Semiconductor Silicon, Electrochemical Society, New York,. 358 (1969).
    • (1969) Semiconductor Silicon , pp. 358
  • 6
    • 33751141117 scopus 로고    scopus 로고
    • note
    • The réflectance simulation was performed using Vertical software package developed by Optical Concepts, Inc.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.