Trap-limited electronic transport in assemblies of nanometer-size TiO2 particles

Physical Review Letters

Volumn 77, Issue 16, 1996, Pages 3427-3430

  De Jongh, P E ^a   Vanmaekelbergh, D ^a  

^a UTRECHT UNIVERSITY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4644321082     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.77.3427     Document Type: Article

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