-
1
-
-
0342921974
-
Low-cost high-display-quality TFT-LCD process
-
C W Kim, J H Lee, H R Nam, et al, "Low-cost high-display-quality TFT-LCD process," EuroDisplay '96 Digest, 591-594 (1996).
-
(1996)
EuroDisplay '96 Digest
, pp. 591-594
-
-
Kim, C.W.1
Lee, J.H.2
Nam, H.R.3
-
2
-
-
6744274408
-
A high-aperture-ratio 3-in -diagonal VGA a-Si light valve with pixel/data and pixel/gate line over-lapping
-
M Sakamoto, T Ukita, A M eda, et al, "A high-aperture-ratio 3-in -diagonal VGA a-Si light valve with pixel/data and pixel/gate line over-lapping," SID Intl Symp Digest Tech Papers, 681-684 (1966).
-
(1966)
SID Intl Symp Digest Tech Papers
, pp. 681-684
-
-
Sakamoto, M.1
Ukita, T.2
Eda, A.M.3
-
3
-
-
0011799128
-
A high aperture and high reliability full color TFT LCD
-
J Z Zhong, W den Boer, Y H Byun, et al, "A high aperture and high reliability full color TFT LCD," SID Intl Symp Digest Tech Papers, 971-974 (1998).
-
(1998)
SID Intl Symp Digest Tech Papers
, pp. 971-974
-
-
Zhong, J.Z.1
Den Boer, W.2
Byun, Y.H.3
-
4
-
-
0004926713
-
High-Information-Content Color 16.3-in. Desktop AMLCD with 15.7 Million a-Si H TFTs
-
K Schleupen, P Alt, P Andry, et al, "High-Information-Content Color 16.3-in. Desktop AMLCD with 15.7 Million a-Si H TFTs," Asia Display '98, 187-191 (1998).
-
(1998)
Asia Display '98
, pp. 187-191
-
-
Schleupen, K.1
Alt, P.2
Andry, P.3
-
5
-
-
0031192865
-
Effects of Nd content in Al thin films on hillock formation
-
T Onishi, E Iwamura, and K Takagi, "Effects of Nd content in Al thin films on hillock formation," J Vac Technol A. 15(4), 2339-2348 (1997).
-
(1997)
J Vac Technol A
, vol.15
, Issue.4
, pp. 2339-2348
-
-
Onishi, T.1
Iwamura, E.2
Takagi, K.3
-
6
-
-
0032068205
-
Evaluation of Al(Nd) alloy f lms for application to thin-film-transistor liquid-crystal displays
-
H Takatsuji, E G Colgan, C Cabrai, Jr., et al, "Evaluation of Al(Nd) alloy f lms for application to thin-film-transistor liquid-crystal displays," IBM J Res and Develop 42(314), 501-508 (1998).
-
(1998)
IBM J Res and Develop
, vol.42
, Issue.314
, pp. 501-508
-
-
Takatsuji, H.1
Colgan, E.G.2
Cabrai Jr., C.3
-
7
-
-
0032311799
-
Characterization of transparent conductors in indium zinc oxide and their application to thin-film-transistor liquid-crystal displays
-
H Takatsuji, T Hiromori, K Tsujimoto, et al, "Characterization of transparent conductors in indium zinc oxide and their application to thin-film-transistor liquid-crystal displays," Mat Res Soc Symp Proc 508, 315-320 (1998).
-
(1998)
Mat Res Soc Symp Proc
, vol.508
, pp. 315-320
-
-
Takatsuji, H.1
Hiromori, T.2
Tsujimoto, K.3
-
8
-
-
0032068679
-
Thin-film-transistor process characterization test structures
-
E G Colgan, R J Polastre, M Takeichi, et al, "Thin-film-transistor process characterization test structures," IBM J Res and Dev 42(3/4), 481-490 (1998).
-
(1998)
IBM J Res and Dev
, vol.42
, Issue.3-4
, pp. 481-490
-
-
Colgan, E.G.1
Polastre, R.J.2
Takeichi, M.3
|