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Volumn 24, Issue 1, 1999, Pages 195-214

Correlation between material properties of ferroelectric thin films and design parameters for microwave device applications: modeling examples and experimental verification

Author keywords

[No Author keywords available]

Indexed keywords

BARIUM COMPOUNDS; LANTHANUM COMPOUNDS; MATHEMATICAL MODELS; MICROWAVE DEVICES; PERMITTIVITY; STRONTIUM COMPOUNDS; THIN FILMS;

EID: 0033294323     PISSN: 10584587     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1080/10584589908215592     Document Type: Article
Times cited : (1)

References (12)
  • 9
    • 85037784791 scopus 로고    scopus 로고
    • Sonnet Software, Inc., Liverpool, NY, CA.; Zeland Software, Inc., Fremont, CA
    • Sonnet Software, Inc., Liverpool, NY, CA.; Zeland Software, Inc., Fremont, CA.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.