Scanning tunneling microscopy and spectroscopy of La0.67Ca0.33MnO3 thin films grown on LaAlO3(100)

Materials Science and Engineering B: Solid-State Materials for Advanced Technology

Volumn 68, Issue 1, 1999, Pages 10-15

  Kar, A K ^a   Dhar, A ^a   Ray, S K ^a   Mathur, B K ^a   Bhattacharya, D ^a   Chopra, K L ^b  

^a INDIAN INSTITUTE OF TECHNOLOGY   (India)

^b INDIAN INSTITUTE OF TECHNOLOGY DELHI   (India)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; CURRENT VOLTAGE CHARACTERISTICS; ENERGY GAP; FERROMAGNETISM; FILM GROWTH; GRAIN BOUNDARIES; MAGNETORESISTANCE; PEROVSKITE; SCANNING TUNNELING MICROSCOPY; SPECTROSCOPIC ANALYSIS; THIN FILMS;

COLOSSAL MAGNETORESISTANCE (CMR); TUNNELING SPECTROSCOPY;

LANTHANUM COMPOUNDS;

EID: 0033285213     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(99)00339-6     Document Type: Article

References (42)

1. von Helmholt R., Wecker J., Holszapfel B., Schultz L., Samwer K. Phys. Rev. Lett. 71:1993;2331.
2. Chahara K.-I., Ohno T., Kasai M., Kozono Y. Appl. Phys. Lett. 63:1993;1990.
3. Jin S., McCormack M., Tiefel T.H., Ramesh R. J. Appl. Phys. 76:1994;6929.
4. Jin S., Tiefel T.H., McCormack M., Fastnacht R.A., Ramesh R., Chen L.H. Science. 264:1994;413.
5. McCormack M., Jin S., Tiefel T.H., Fleming R.M., Phillips J.M., Ramesh R. Appl. Phys. Lett. 64:1994;3045.
6. Wollan E.O., Koehler W.C. Phys. Rev. 100:1955;545.
7. Zeng X.T., Wong H.K., Xu J.B., Wilson I.H. Appl. Phys. Lett. 67:1995;3272.
8. Vas'ko V.A., Nordman C.A., Kraus P.A., Achutharaman V.S., Ruosi A.R., Goldman A.M. Appl. Phys. Lett. 68:1996;2571.
9. Chung B.W., Brosha E.L., Garzon F.H., Raistrick I.D., Houlton R.J., Hawley M.E. J. Mater. Res. 10:1995;2518.
10. Ramaswamy G., Raychaudhuri A.K. J. Appl. Phys. 80:1996;4519.
11. Yeh N.-C., Fu C.-C., Wei J.Y.T., Vasquez R.P., Huynh J., Maurer S.M., Beach G., Beam D.A. J. Appl. Phys. 81:1997;5499.
12. Biswas A., Raychaudhuri A.K. J. Phys. Condens. Matter. 8:1996;L739.
13. Chainani A., Mathew M., Sarma D.D. Phys. Rev. B. 47:1993;15 397.
14. Saitoh T., Bocquet A.E., Mizokawa T., Namatame H., Fujimori A., Abbate M., Takeda Y., Takano M. Phys. Rev. B. 51:1995;13 942.
15. Okimoto Y., Katsufuji T., Ishikawa T., Urushibara A., Arima T., Tokura Y. Phys. Rev. Lett. 75:1995;109.
16. McIlroy D.N., Zhang J., Liou S.-H., Dowben P.A. Phys. Lett. A. 207:1995;367.
17. Park J.-H., Chen C.T., Cheong S.-W., Bao W., Meigs G., Chakarian V., Idzerda Y.U. J. Appl. Phys. 79:1996;4558.
18. Park J.-H., Chen C.T., Cheong S.-W., Bao W., Meigs G., Chakarian V., Idzerda Y.U. Phys. Rev. Lett. 76:1996;4215.
19. Vasquez R.P. Phys. Rev. B. 54:1996;14 938.
20. McIlroy D.N., Waldfried C., Zhang J., Choi J.-W., Foong F., Liou S.-H., Dowben P.A. Phys. Rev. B. 54:1996;17 438.
21. Pickett W.E., Singh D.J. Phys. Rev. B. 53:1996;1146.
22. Satpathy S., Popovic Z.S., Vukajlovic F.R. Phys. Rev. Lett. 76:1996;960.
23. Satpathy S., Popovic Z.S., Vukajlovic F.R. J. Appl. Phys. 79:1996;4555.
24. Güntherodt H.-J., Wiesendanger R. Scanning Tunneling Microscopy I: General Principles and Applications to Clean and Adsorbate-Covered Surfaces. 1994;Springer-Verlag, Berlin. ; and the references therein.
25. Krishnan K.M., Modak A.R., Lucas C.A., Michel R., Cherry H.B. J. Appl. Phys. 79:1996;5169.
26. Wiesendanger R. Scanning Probe Microscopy and Spectroscopy: Methods and Applications. 1994;Cambridge University Press, New York.
27. Stroscio J.A., Feenstra R.M., Fein A.P. Phys. Rev. Lett. 57:1986;2579.
28. Stroscio J.A., Feenstra R.M., Fein A.P. J. Vac. Sci. Technol. A. 5:1987;838.
29. Stroscio J.A., Feenstra R.M. J. Vac. Sci. Technol. B. 6:1988;1472.
30. Kar A.K., Dhar A., Ray S.K., Mathur B.K., Bhattacharya D., Chopra K.L. J. Phys.: Condens. Matter. 10:1998;10 795.
31. Surowiak Z., Nikitin Y.S., Biryukov S.V., Golovko I.I., Mukhortov V.M., Dudkevich V.P. Thin Solid Films. 208:1992;76.
32. Mathur N.D., Burnell G., Isaac S.P., Jackson T.J., Teo B.-S., MacManus-Driscoll J.L., Cohen L.F., Evetts J.E., Blamire M.G. Nature. 387:1997;266. ; and the references therein.
33. Gommert E., Cerva H., Rucki A., Helmolt R.V., Wecker J., Kuhrt C., Samwer K. J. Appl. Phys. 81:1997;5496.
34. Wilson M.L., Byers J.M., Dorsey P.C., Horwitz J.S., Chrisey D.B., Osofsky M.S. J. Appl. Phys. 81:1997;4971.
35. Feenstra R.M., Stroscio J.A. Phys. Scripta T. 19:1987;55.
36. Loehman R.E. Characterization of Ceramics. 1993;Butterworth-Heinemann, London.
37. Davydov D.N., Mayou D., Berger C., Gignoux C., Neumann A., Jansen A.G.M., Wyder P. Phys. Rev. Lett. 77:1996;3173.
38. Mahendiran R., Raychaudhuri A.K., Chainani A., Sarma D.D., Roy S.B. Appl. Phys. Lett. 66:1995;233.
39. Arima T., Tokura Y., Torrance J.B. Phys. Rev. B. 48:1993;17 006.
40. Núñez-Regueiro J.E., Gupta D., Kadin M.N. J. Appl. Phys. 79:1996;5179.
41. Blasco J., García J., de Teresa J.M., Ibarra M.R., Algarabel P.A., Marquina C. J. Phys. Condens. Matter. 8:1996;7427.
42. Mahendiran R., Mahesh R., Raychaudhuri A.K., Rao C.N.R. Solid State Commn. 94:1995;515.