Effects of lattice distortion on the physical properties and surface morphology of magnetoresistive perovskite epitaxial films

Journal of Applied Physics

Volumn 81, Issue 8 PART 2B, 1997, Pages 5499-5501

  Yeh, N C ^a   Fu, C C ^a   Wei, J Y T ^a   Vasquez, R P ^b   Huynh, J ^c   Maurer, S M ^c   Beach, G ^b,c   Beam, D A ^c  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^b CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^c California Institute of Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001742622     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.364580     Document Type: Article

References (19)

1. S. Jin, T. H. Tiefel, M. McCormack, R. A. Fastnacht, R. Ramesh, and L. H. Chen, Science 264, 413 (1994); Appl. Phys. Lett. 66, 382 (1995); 67, 557 (1995).
2. S. Jin, T. H. Tiefel, M. McCormack, R. A. Fastnacht, R. Ramesh, and L. H. Chen, Science 264, 413 (1994); Appl. Phys. Lett. 66, 382 (1995); 67, 557 (1995).
3. S. Jin, T. H. Tiefel, M. McCormack, R. A. Fastnacht, R. Ramesh, and L. H. Chen, Science 264, 413 (1994); Appl. Phys. Lett. 66, 382 (1995); 67, 557 (1995).
4. H. Y. Hwang, P. G. Radaelli, M. Marezio, and B. Batlogg, Phys. Rev.Lett. 75, 914 (1995).
5. Y. Moritomo, A. Asamitsa, and Y. Tokura, Phys. Rev. B 51, 16 491 (1995); K. Khazeni, Y. X. Jia, L. Lu, V. H. Crespi, M. L. Cohen, and A. Zettl, Phys. Rev. Lett. 76, 295 (1996).
6. Y. Moritomo, A. Asamitsa, and Y. Tokura, Phys. Rev. B 51, 16 491 (1995); K. Khazeni, Y. X. Jia, L. Lu, V. H. Crespi, M. L. Cohen, and A. Zettl, Phys. Rev. Lett. 76, 295 (1996).
7. M. R. Ibarra, P. A. Algarabel, C. Marquina, J. Blasco, and J. Garcia, Phys. Rev. Lett. 75, 3541 (1995).
8. G.-M. Zhao, K. Conder, H. Keller, and K. A., Müller, Nature (London) 381, 676 (1996).
9. A. J. Millis, P. B. Littlewood, and B. I. Shraiman, Phys. Rev. Lett. 74, 5144 (1995); A. J. Millis, B. I. Shraiman, and R. Mueller, ibid. 77, 175 (1996).
10. A. J. Millis, P. B. Littlewood, and B. I. Shraiman, Phys. Rev. Lett. 74, 5144 (1995); A. J. Millis, B. I. Shraiman, and R. Mueller, ibid. 77, 175 (1996).
11. H. Ohbayashi, T. Kudo, and T. Gejo, Jpn. J. Appl. Phys. 13, 1 (1974).
12. R. Mahendiran, A. K. Raychaudhuri, A. Chainani, and D. D. Sarma, J. Phys., Condens. Matter 7, L561 (1995); S. Yamaguchi, H. Taniguchi, H. Takagi, T. Arima, and Y. Tokura, J. Phys., Condens. Matter 64, 1885 (1995).
13. R. Mahendiran, A. K. Raychaudhuri, A. Chainani, and D. D. Sarma, J. Phys., Condens. Matter 7, L561 (1995); S. Yamaguchi, H. Taniguchi, H. Takagi, T. Arima, and Y. Tokura, J. Phys., Condens. Matter 64, 1885 (1995).
14. N.-C. Yeh, R. P. Vasquez, D. A. Beam, C.-C. Fu, H. Huynh, and G. Beach, (submitted to J. Phys., Condens, Matter).
15. R. P. Vasquez, Phys. Rev. B 54, 14 938 (1996).
16. A. V. Boris, A. V. Bazhenov, N. N. Kovaleva, A. V. Samoilov, N.-C. Yeh, and R. P. Vasquez, J. Appl. Phys. 81 (1997).
17. For the definition of the surface roughness, see, for example, M. Ohring, The Material Science of Thin Films (Academic, San Diego, CA. 1992).
18. Y. Tokura, A. Urushibara, Y. Moritomo, T. Arima, and A. Asamitsu, J. Phys. Soc. Jpn. 63, 3931 (1994); H. Y. Hwang, S.-W. Cheong, N. P. Ong. and B. Batlogg, Phys. Rev. Lett. 77, 2041 (1996).
19. Y. Tokura, A. Urushibara, Y. Moritomo, T. Arima, and A. Asamitsu, J. Phys. Soc. Jpn. 63, 3931 (1994); H. Y. Hwang, S.-W. Cheong, N. P. Ong. and B. Batlogg, Phys. Rev. Lett. 77, 2041 (1996).