Strong self-focusing of a 7.2 MeV electron beam striking an aluminized mylar target

IEEE Transactions on Plasma Science

Volumn 27, Issue 6, 1999, Pages 1566-1571

  Vermare, C ^a,b   Labrouche, J ^a,b   De Le Taillandier Gabory, P ^a,b   Villate, D ^a,b   Donohue, J T ^a,b  

^a CEA/Ctr d'Ktudes Scientifiques T   (France)

^b CENTRE D ETUDES NUCLÉAIRES DE BORDEAUX GRADIGNAN   (France)

Author keywords

Electron beams, induction machine, particle beam measurement, secondary ion emission

Indexed keywords

ALUMINUM; COMPUTER SIMULATION; ELECTRIC SPACE CHARGE; ELECTRON IRRADIATION; ELECTRON OPTICS; FOCUSING; IONS; RADIATION EFFECTS; TARGETS;

MYLAR; SECONDARY ION EMISSION;

ELECTRON BEAMS;

EID: 0033280783     PISSN: 00933813     EISSN: None     Source Type: Journal    
DOI: 10.1109/27.808927     Document Type: Article

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