Observation of strong self-focusing of an intense relativistic electron beam impinging on a SiO2 target

IEEE Transactions on Plasma Science

Volumn 27, Issue 5, 1999, Pages 1501-1509

  Vermare, C ^a   Donohue, John T ^a   Labrouche, J ^a   De Gabory, P Le Taillandier ^a   Villate, D ^a  

^a CEA CESTA   (France)

Author keywords

Electron beams; Induction machine; Particle beam measurement; Secondary ion emission

Indexed keywords

ALUMINUM FOIL; COMPUTER SIMULATION; ELECTRIC SPACE CHARGE; ELECTRON IRRADIATION; ELECTRON OPTICS; FOCUSING; IONS; MATHEMATICAL MODELS; PROTONS; SILICA;

INDUCTION MACHINES; PARTICLE-IN-CELL SIMULATION; SECONDARY ION EMISSION;

ELECTRON BEAMS;

EID: 0033204110     PISSN: 00933813     EISSN: None     Source Type: Journal    
DOI: 10.1109/27.799832     Document Type: Article

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