Ultrahigh density data storage in an organic film with a scanning tunneling microscope

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 17, Issue 6, 1999, Pages 2467-2470

  Hou, S M ^a   Zhao, X Y ^a   Yang, C ^a   Xue, Z Q ^a   Yang, W J ^a   Chen, H Y ^a  

^a PEKING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0033273510     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.591113     Document Type: Article

References (10)

1. A. Sato and Y. Tsukamoto, Nature (London) 363, 431 (1993).
2. A. Sato, S. Momose, and Y. Tsukamoto, J. Vac. Sci. Technol. B 13, 2823 (1995).
3. H. Kada and T. Toha, Appl. Phys. Lett. 66, 2961 (1995).
4. K. Yano et al., Appl. Phys. Lett. 68, 188 (1996).
5. H. J. Gao, D. W. Wang, N. Liu, Z. Q. Xue, and S. J. Pang, J. Vac. Sci. Technol. B 14, 349 (1996).
6. L. P. Ma, Y. L. Song, H J. Gao, W. B. Zhao, H. Y. Chen, Z. Q. Xue, and S. J. Pang, Appl. Phys. Lett. 69, 3752 (1996).
7. H. J. Gao, L. P. Ma, H. X. Zhang, H. Y. Chen, Z. Q. Xue, and S. J. Pang, J. Vac. Sci. Technol. B 15, 1581 (1997).
8. Q. C. Yang, Y. Q. Tang, W. J. Yang, and H. Y. Chen, Acta Crystallogr. Sect. C: Cryst. Struct. Commun. 54, 1532 (1998).
9. C. J. Fritchie, Acta Crystallogr. 20, 892 (1966).
10. C. J. Chen, Introduction to Scanning Tunneling Microscopy (Oxford University, New York, 1993).