Surface roughness and resonant scattering effects in soft X-ray speckle from random semiconductor interfaces

Surface Review and Letters

Volumn 6, Issue 6, 1999, Pages 1121-1128

  Adamcyk, M ^a   Eisebitt, S ^b   Karl, A ^b   Nicoll, C ^a   Pinnington, T ^a   Scherer, R ^b   Tiedje, T ^a   Eberhardt, W ^b  

^a UNIVERSITY OF BRITISH COLUMBIA   (Canada)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0033272765     PISSN: 0218625X     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0218625X99001244     Document Type: Article

References (11)

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