Charge screening around Si dopant atoms in GaAs by X-STM

Czechoslovak Journal of Physics

Volumn 49, Issue 11, 1999, Pages 1621-1624

  Pacherova O ^a   Slezak J ^a   Cukr, M ^a   Bartos I ^a  

^a INSTITUTE OF PHYSICS   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0033267149     PISSN: 00114626     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1022832217848     Document Type: Article

References (5)

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4. M.C.M.M. van der Wielen, A.J.A. van Roij, and H. van Kempen: Phys. Rev. Lett. 76 (1996) 1075.
5. J. Friedel: Nuovo Cimento 7 (1958) 287.