Raman and RAS measurements on uniaxially strained thin semiconductor layers

Physica Status Solidi (B) Basic Research

Volumn 211, Issue 1, 1999, Pages 309-316

  Liarokapis, E ^a   Papadimitriou, D ^a   Rumberg, J ^b   Richter, W ^b  

^a NATIONAL TECHNICAL UNIVERSITY OF ATHENS   (Greece)

^b TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0033249301     PISSN: 03701972     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-3951(199901)211:1<309::AID-PSSB309>3.0.CO;2-W     Document Type: Article

References (10)

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