Study of correlation between the microstructure and phase inhomogeneities of Y-Ba-Cu-O epitaxial films and their DC and microwave properties

Superconductor Science and Technology

Volumn 12, Issue 11, 1999, Pages 908-911

  Vorobiev, A K ^a   Drozdov, Y N ^a   Gusev, S A ^a   Mironov, V L ^a   Vostokov, N V ^a   Kluenkov, E B ^a   Gaponov, S V ^a   Talanov, V V ^b  

^a INSTITUTE FOR PHYSICS OF MICROSTRUCTURES   (Russian Federation)

^b UNIVERSITY OF MARYLAND   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC SPECTROSCOPY; COPPER; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CRYSTAL LATTICES; ELECTRIC PROPERTIES; MAGNETRON SPUTTERING; MICROSTRUCTURE; PHASE COMPOSITION; SCANNING TUNNELING MICROSCOPY; SUPERCONDUCTING TRANSITION TEMPERATURE; YTTRIUM COMPOUNDS;

MICROWAVE PROPERTIES; MICROWAVE SURFACE RESISTANCE; PHASE INHOMOGENEITIES; PLANE MISORIENTATION; SEMICONDUCTING PROPERTIES;

THIN FILMS;

EID: 0033226274     PISSN: 09532048     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-2048/12/11/364     Document Type: Article

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