Large-area YBa2Cu3O7-x bolometers on Si substrates

Superconductor Science and Technology

Volumn 12, Issue 11, 1999, Pages 856-858

  Vale, L R ^a   Ono, R H ^a   McDonald, D G ^b   Phelan, R J ^b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b Boulder Metric Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BOLOMETERS; CRYOSTATS; NICKEL ALLOYS; OPTICAL VARIABLES MEASUREMENT; PASSIVATION; RESISTORS; SEMICONDUCTING SILICON; SPURIOUS SIGNAL NOISE; SUBSTRATES; THERMAL CONDUCTIVITY; THERMOMETERS; YTTRIUM BARIUM COPPER OXIDES;

NICKEL CHROMIUM ALLOYS; REAL TIME MEASUREMENT; THERMAL CONDUCTANCE;

OXIDE SUPERCONDUCTORS;

EID: 0033226238     PISSN: 09532048     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-2048/12/11/349     Document Type: Article

References (6)

1. Brehner H, Ruhrnschopf K, Wedler G and Rauch W 1993 Surface reactions and long time stability of YBCO thin films Physica C 208 419-24
2. McDonald D G, Phelan R J, Vale L R, Ono R H, Rice J P et al 1997 Noise from YBCO films: size and substrate dependence IEEE Trans. Appl. Supercond. 7 3091-5
3. 3 and STO substrates IEEE Trans. Appl. Supercond. 7 3193-6
4. 3 structures Appl. Phys. Lett. 52 924-6
5. Chang C A 1988 Reduced moisture induced degradation of YBCO films by silver and high deposition temperatures Appl. Phys. Lett. 53 1113-15
6. McDonald D G, Phelan R J, Vale L R, Ono R H and Rudman D A 1999 Passivation, transition width and noise for YBCO bolometers on Si IEEE Trans. Appl. Supercond. Supercond. Sei. Technol. 12 (1999) 859-863.