Noise from YBCO films: Size and substrate dependence

IEEE Transactions on Applied Superconductivity

Volumn 7, Issue 2 PART 3, 1997, Pages 3091-3095

  McDonald, D G ^a   Phelan Jr , R J ^b   Vale, L R ^c   Ono, R H ^b   Ricet, J P ^a   Borcherdt, L ^b   Rudman, D A ^c   Cosgrove, J ^b   Rosenthal, P ^a  

^a Boulder Metric Inc   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^c Advanced Fuel Research Incorporated   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; OXIDE SUPERCONDUCTORS; SPURIOUS SIGNAL NOISE; STRAIN; SUBSTRATES;

BIAS CURRENT; ELECTRIC NOISE MEASUREMENT;

SUPERCONDUCTING FILMS;

EID: 0031163264     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.621986     Document Type: Article

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