Analog self-test based on differential IDD monitoring supported by differential IOUT checking

Analog Integrated Circuits and Signal Processing

Volumn 21, Issue 1, 1999, Pages 33-44

  Sidiropulos, Michalis ^a   Stopjaková, Viera ^b   Manhaeve, Hans ^c   Musil, Vladislav ^a  

^a BRNO UNIVERSITY OF TECHNOLOGY   (Czech Republic)

^b SLOVAK UNIVERSITY OF TECHNOLOGY   (Slovakia)

^c Katholieke Hogeschool Brugge Oostende   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; CMOS INTEGRATED CIRCUITS; DESIGN FOR TESTABILITY; INTEGRATED CIRCUIT TESTING; VLSI CIRCUITS;

POWER SUPPLY CURRENT MONITORING TECHNIQUES;

INTEGRATED CIRCUIT LAYOUT;

EID: 0033206778     PISSN: 09251030     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1008323710015     Document Type: Article

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