Implementation of BIC monitor in balanced analogue self-test

Electronics Letters

Volumn 32, Issue 20, 1996, Pages 1841-1842

  Sidiropulos, M ^a   Stopjakova, V ^b   Manhaeve, H ^c  

^a BRNO UNIVERSITY OF TECHNOLOGY   (Czech Republic)

^b SLOVAK UNIVERSITY OF TECHNOLOGY   (Slovakia)

^c Katholieke Hogeschool Brugge Oostende   (Belgium)

Author keywords

Built in self test; Electric current measurement

Indexed keywords

ELECTRIC POWER SUPPLIES TO APPARATUS; ELECTRIC POWER SYSTEMS; INTEGRATED CIRCUITS; MONITORING; SCHEMATIC DIAGRAMS; SIMULATION;

BUILT-IN SELF TEST; CURRENT CONVEYOR;

ELECTRIC CURRENT MEASUREMENT;

EID: 0030233710     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:19961297     Document Type: Article

References (6)

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3. HAWKINS, C.F., and SODEN, J.M.: 'Electrical characteristics and testing considerations for gate oxide shorts in CMOS ICY. Proc. 1985 Test. Conf., 1985, Philadelphia, PA, pp. 544-555
4. BELL, I.M., CAMPLIN, D.A., TAYLOR, G.E., and BANNISTER, B.R.: 'Supply current testing of mixed analogue and digital ICs', Electron. Lett., 1991, 27, (17), pp. 1581-1583
5. dd test circuitry for mixed signal ICY (Department of Electronics, University of Cantabria, Spain, 1994), Electron. Lett., 30, (6). pp. 485-486
6. DDQ testing of CMOS VLSI circuits'. IEEE European Test Workshop, 12-14 June 1996, Montpellier, France