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Volumn 31, Issue 1-2, 1999, Pages 1-8

Rietveld refinement of the pure aluminophosphate AlPO4-40

Author keywords

AFR; AlPO4 40; Aluminophosphate; Rietveld refinement; Synchrotron powder diffraction

Indexed keywords

CRYSTAL SYMMETRY; DIFFRACTION; LATTICE CONSTANTS; NUCLEAR MAGNETIC RESONANCE; PHOSPHORUS; SYNCHROTRONS;

EID: 0033204495     PISSN: 13871811     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1387-1811(99)00052-9     Document Type: Article
Times cited : (31)

References (11)
  • 6
    • 0003893314 scopus 로고
    • Zurich: Institut für Kristallographie und Petrographie, ETH
    • Baerlocher Ch. X-ray Rietveld System XRS-82. 1982;Institut für Kristallographie und Petrographie, ETH, Zurich.
    • (1982) X-ray Rietveld System XRS-82
    • Baerlocher, Ch.1
  • 11
    • 0039289463 scopus 로고
    • Ph.D. thesis, ETH, Zurich
    • A. Simmen, Ph.D. thesis, ETH, Zurich, 1992.
    • (1992)
    • Simmen, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.