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Skaife and Abbott used atomic force microscopy (AFM) to characterize quantitatively structural anisotropy within ultrathin (thickness of ~10 nm) obliquely deposited films of gold (Skaife, J. J.; Abbott, N. L. Chem. Mater. 1999, 11, 612-623). These gold films are formed of grains with lateral dimensions of ~20 nm and radii of curvatures of ~-50 nm. Although anisotropy within these films cannot be seen unambiguously by visual inspection of AFM images, a quantitative analysis of the AFM profiles shows a subtle level of anisotropy on wavelengths comparable with the size of the gold grains (~20 nm). Their analysis revealed the root-mean-square (RMS) slope of the surface topography to be greater by approximately a degree in the direction parallel to the direction of deposition of the gold as compared with the perpendicular direction. They also find the RMS curvature of the grains of gold to be greatest in a direction parallel to deposition.
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Several other equations can be used to represent the profile of the drop and to satisfy the criterion for the contact angle at the surface. For quantitative predictions, the drop profile that best captures the actual experimental profile should be used. The choice of the profile will depend on the interfacial tensions of the solid-liquid and the liquidvapor interfaces as well as the effects of gravity. Our future work will explore the effects of drop shape and size using numerical simulations
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