View-based recognition using an eigenspace approximation to the Hausdorff measure

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 21, Issue 9, 1999, Pages 951-955

  Huttenlocher, Daniel P ^a   Lilien, Ryan H ^a   Olson, Clark F ^a  

^a Department of Computer Science and School of Operations Research and Information Engineering   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EIGENVALUES AND EIGENFUNCTIONS; FEATURE EXTRACTION; IMAGE PROCESSING; LEAST SQUARES APPROXIMATIONS; PATTERN MATCHING;

EIGENSPACE APPROXIMATION; HAUSDORFF MATCHING; IMAGE MATCHING; SUBSPACE METHODS; VIEW BASED RECOGNITION;

OBJECT RECOGNITION;

EID: 0033189175     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/34.790437     Document Type: Article

References (8)

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