View-based and modular eigenspaces for face recognition

Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition

Volumn , Issue , 1994, Pages 84-91

  Pentland, Alex ^a   Moghaddam, Baback ^a   Starner, Thad ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATABASE SYSTEMS; EIGENVALUES AND EIGENFUNCTIONS; IMAGE PROCESSING; LARGE SCALE SYSTEMS; THREE DIMENSIONAL; VECTORS;

AUTOMATIC FEATURE EXTRACTION; EIGENFACES; EIGENVECTOR DECOMPOSITION; FACE RECOGNITION; FEATURE EIGENTEMPLATES; MODULAR EIGENSPACE DESCRIPTION TECHNIQUE; VIEW BASED EIGENSPACE; VISUAL RECOGNITION;

PATTERN RECOGNITION;

EID: 0027928121     PISSN: 10636919     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/cvpr.1994.323814     Document Type: Conference Paper

References (14)