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Volumn 14, Issue 4, 1999, Pages 607-614

A comparison of IGBT models for use in circuit design

Author keywords

Device modeling; Device simulation; Hefner model; IGBT's; Kraus model; Parameter extraction

Indexed keywords

COMPUTER SIMULATION; GATES (TRANSISTOR); INTEGRATED CIRCUIT LAYOUT; POWER INTEGRATED CIRCUITS; SEMICONDUCTOR DEVICE MODELS;

EID: 0033154004     PISSN: 08858993     EISSN: None     Source Type: Journal    
DOI: 10.1109/63.774196     Document Type: Review
Times cited : (14)

References (10)
  • 1
    • 29144505545 scopus 로고
    • An analytical model for the steady state and transient characteristics of the power insulated-gate bipolar transistor
    • A. Hefner and D. Blackburn, "An analytical model for the steady state and transient characteristics of the power insulated-gate bipolar transistor," Solid State Electron., vol. 31, no. 10, pp. 1513-1532, 1988.
    • (1988) Solid State Electron. , vol.31 , Issue.10 , pp. 1513-1532
    • Hefner, A.1    Blackburn, D.2
  • 2
    • 0027150156 scopus 로고    scopus 로고
    • An analytical model of IGBT'swith low emitter efficiency
    • Monterey CA
    • R. Kraus and K. Hoffmann, "An analytical model of IGBT'swith low emitter efficiency," in ISPSD'93, Monterey CA, pp. 30-34.
    • ISPSD'93 , pp. 30-34
    • Kraus, R.1    Hoffmann, K.2
  • 3
    • 0003160337 scopus 로고    scopus 로고
    • Analysis and modeling of the technology-dependent electrothermal IGBT characteristies
    • Yokohama, Japan
    • R. Kraus, K. Hoffmann, and P. Türkes, "Analysis and modeling of the technology-dependent electrothermal IGBT characteristies," in Proc. IPEC'95, Yokohama, Japan, pp. 1128-1133.
    • Proc. IPEC'95 , pp. 1128-1133
    • Kraus, R.1    Hoffmann, K.2    Türkes, P.3
  • 5
    • 0028317906 scopus 로고
    • Insulated gate bipolar transistor (IGBT) modeling using IG-SPICE
    • C. S. Mitter, A. R. Hefner, D. Y. Chen, and F. C. Lee, "Insulated gate bipolar transistor (IGBT) modeling using IG-SPICE," IEEE Trans. Ind. Applicat., vol. 30, no. 1, pp. 24-33, 1993.
    • (1993) IEEE Trans. Ind. Applicat. , vol.30 , Issue.1 , pp. 24-33
    • Mitter, C.S.1    Hefner, A.R.2    Chen, D.Y.3    Lee, F.C.4
  • 7
    • 0030416977 scopus 로고    scopus 로고
    • Validation and extension of IGBT compact model with parameter extraction
    • London, U.K., June
    • Z. M. Li, P. A. Mawby, M. S. Khanniche, and K. Board, "Validation and extension of IGBT compact model with parameter extraction," in IEE Colloquium, London, U.K., June 1996.
    • (1996) IEE Colloquium
    • Li, Z.M.1    Mawby, P.A.2    Khanniche, M.S.3    Board, K.4
  • 8
    • 21644468814 scopus 로고
    • Hewlett Packard, Santa Clara, CA
    • ICCAP User's Manual, Hewlett Packard, Santa Clara, CA, 1991.
    • (1991) ICCAP User's Manual


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.