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Volumn 14, Issue 4, 1999, Pages 601-606

Modeling the [dV/dt] of the IGBT during inductive turn off

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC INVERTERS; ELECTRIC LOSSES; ELECTRIC POTENTIAL; GATES (TRANSISTOR); PULSE WIDTH MODULATION; SEMICONDUCTOR DEVICE MODELS;

EID: 0033153994     PISSN: 08858993     EISSN: None     Source Type: Journal    
DOI: 10.1109/63.774195     Document Type: Article
Times cited : (35)

References (8)
  • 1
    • 0005283642 scopus 로고
    • Switching speed enhancement in insulated gate transistors by electron irradiation
    • Dec.
    • B. J. Baliga, "Switching speed enhancement in insulated gate transistors by electron irradiation," IEEE Trans. Electron Devices, vol. ED-31, pp. 1790-1795, Dec. 1984.
    • (1984) IEEE Trans. Electron Devices , vol.ED-31 , pp. 1790-1795
    • Baliga, B.J.1
  • 2
    • 0030702464 scopus 로고    scopus 로고
    • Increasing the switching speed of high voltage IGBT's
    • F. Robb, I. Wan, and S. Yu, "Increasing the switching speed of high voltage IGBT's," in Proc. ISPSD97, pp. 251-254.
    • Proc. ISPSD97 , pp. 251-254
    • Robb, F.1    Wan, I.2    Yu, S.3
  • 3
    • 29144505545 scopus 로고
    • An analytical model for the steady state and transient characteristics of the power insulated gate bipolar transistor
    • A. R. Heffner and D. L. Blackburn, "An analytical model for the steady state and transient characteristics of the power insulated gate bipolar transistor," Solid State Electron., vol. 31, no. 10, pp. 1513-1532, 1988.
    • (1988) Solid State Electron. , vol.31 , Issue.10 , pp. 1513-1532
    • Heffner, A.R.1    Blackburn, D.L.2
  • 4
    • 84939345690 scopus 로고
    • A performance trade-off for the insulated gate bipolar transistor: Buffer layer versus base lifetime reduction
    • July
    • _, "A performance trade-off for the insulated gate bipolar transistor: Buffer layer versus base lifetime reduction," IEEE Trans. Power Electron., vol. PE-2, pp. 194-207, July 1987.
    • (1987) IEEE Trans. Power Electron. , vol.PE-2 , pp. 194-207
  • 5
    • 0025497993 scopus 로고
    • An improved understanding for the transient operation of the power insulated gate bipolar transistor
    • Oct.
    • A. Heffner, "An improved understanding for the transient operation of the power insulated gate bipolar transistor," IEEE Trans. Power Electron., vol. 5, pp. 459-468, Oct. 1990.
    • (1990) IEEE Trans. Power Electron. , vol.5 , pp. 459-468
    • Heffner, A.1
  • 6
    • 0026136708 scopus 로고
    • An investigation of the drive circuit requirements for the power insulated gate bipolar transistor
    • Apr.
    • _, "An investigation of the drive circuit requirements for the power insulated gate bipolar transistor," IEEE Trans. Power Electron., vol. 6, pp. 208-219, Apr. 1991.
    • (1991) IEEE Trans. Power Electron. , vol.6 , pp. 208-219
  • 7
    • 0031139381 scopus 로고    scopus 로고
    • Modeling the turn-off of IGBT's in hard and soft switching applications
    • May
    • M. Trivedi and K. Shenai, "Modeling the turn-off of IGBT's in hard and soft switching applications," IEEE Trans. Electron Devices, vol. 44, pp. 887-893, May 1997.
    • (1997) IEEE Trans. Electron Devices , vol.44 , pp. 887-893
    • Trivedi, M.1    Shenai, K.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.