Device reliability and robust power converter development

Microelectronics Reliability

Volumn 39, Issue 6-7, 1999, Pages 1121-1130

  Keskar, N ^a   Trivedi, M ^a   Shenai, K ^a  

^a 1120 Science and Engineering Offices   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; COMPUTER SIMULATION; DEFECTS; ELECTRIC CURRENTS; FAILURE ANALYSIS; OPTIMIZATION; POWER CONVERTERS; RELIABILITY; SEMICONDUCTOR SWITCHES; TEMPERATURE DISTRIBUTION;

CIRCUIT SIMULATOR; CURRENT DOUBLER; FULL BRIDGE CONVERTERS; SEMICONDUCTOR POWER SWITCH; THERMAL MANAGEMENT;

POWER ELECTRONICS;

EID: 0033145282     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(99)00159-6     Document Type: Article

References (7)

1. M. Trivedi and K. Shenai, "Framework for Power Package Design and Optimization," Proc. IEEE Intl. Workshop on Integrated Power Packaging, 1998, pp. 35-39.
2. ATLAS Users Manual, Silvaco International, Santa Clara, CA, 1998.
3. SABER Users Manual, Analogy Inc., Beaverton, OR, 1998.
4. M. Trivedi and K. Shenai, "Failure Mechanisms of IGBTs Under Short-Circuit and Clamped Inductive Switching Stress," IEEE Trans. Power Electronics, vol. 14, no. 1, pp. 108-116, 1999.
5. J. A. Sabate, F. C. Lee et al., "Design Considerations for High-Voltage High-Power Full-Bridge Zero-Voltage Switched PWM Converter", APEC '90, pp. 275-284
6. N. H. Kutkut, "A Full-Bridge Soft Switched Telecom Power Supply with a Current Doubler Rectifier", INTELEC '95, 16-30.
7. G. Busatto and O. Fioretto, "Non-Destructive Testing of Power MOSFETs: Failures During Reverse Recovery of Drain-Source Diode", PESC '96, pp. 593-599