Stability of PPV based light emitting diodes

Synthetic Metals

Volumn 102, Issue 1-3, 1999, Pages 1097-1098

  Nguyen, T P ^a   Garnier, A ^a   Chen, L C ^a   De Kok, M ^a   Vanderzande, D ^a   Tran, V H ^a  

^a INSTITUT DES MATÉRIAUX JEAN ROUXEL   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT DENSITY; CURRENT VOLTAGE CHARACTERISTICS; DEGRADATION; ELECTRIC CONDUCTIVITY; LIGHT EMISSION; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR DEVICE STRUCTURES; VINYL RESINS;

DARK SPOT FORMATION; POLYPHENYLENE VINYLENE;

LIGHT EMITTING DIODES;

EID: 0033137854     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0379-6779(98)01384-8     Document Type: Article

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5. I.D. Parker J. Appl. Phys. 75 1994 789
6. J.G. Simmons J. Phys. D: Appl. Phys. 4 1971 613