Inference about defects in the presence of masking

Technometrics

Volumn 38, Issue 3, 1996, Pages 247-255

  Flehinger, Betty J ^a   Reiser, Benjamin ^a   Yashchin, Emmanuel ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

Competing causes; Partial information; Reliability; Success failure data

Indexed keywords

EID: 0009131531     PISSN: 00401706     EISSN: 15372723     Source Type: Journal    
DOI: 10.1080/00401706.1996.10484504     Document Type: Article

References (14)

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