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Volumn 425, Issue 1, 1999, Pages 343-346

Two-level model for heavily irradiated silicon detectors

Author keywords

[No Author keywords available]

Indexed keywords

FERMI LEVEL; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE MODELS;

EID: 0033114950     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(98)01378-3     Document Type: Article
Times cited : (13)

References (21)
  • 4
    • 0032206883 scopus 로고    scopus 로고
    • Temperature and frequency dependence of the capacitance of heavily irradiated silicon diodes
    • E. Borchi, M. Bruzzi, S. Pirollo, S. Sciortino, Temperature and frequency dependence of the capacitance of heavily irradiated silicon diodes, on Solid State Electron. 42 (11) (1998) 2093.
    • (1998) Solid State Electron. , vol.42 , Issue.11 , pp. 2093
    • Borchi, E.1    Bruzzi, M.2    Pirollo, S.3    Sciortino, S.4
  • 5
    • 85031625529 scopus 로고    scopus 로고
    • Modelling of observed double junction effect
    • Presented at the 2nd Int. Conf. on Radiation Effects on Semiconductor Materials, Detectors and Devices, Florence, March 4-6 in press
    • D. Menichelli, M. Bruzzi, Z. Li, V. Eremin, Modelling of observed double junction effect, Presented at the 2nd Int. Conf. on Radiation Effects on Semiconductor Materials, Detectors and Devices, Florence, March 4-6 1998, Nucl. Instr. and Meth. A, in press.
    • (1998) Nucl. Instr. and Meth. A
    • Menichelli, D.1    Bruzzi, M.2    Li, Z.3    Eremin, V.4
  • 6
    • 85031635407 scopus 로고    scopus 로고
    • Study of the evolution of active volume in irradiated silicon detectors
    • Presented at the 2nd Int. Conf. on Radiation Effects on Semiconductor Materials, Detectors and Devices, Florence, March 4-6 in press
    • G. Casse, M. Glaser, E. Grigoriev, Study of the evolution of active volume in irradiated silicon detectors, Presented at the 2nd Int. Conf. on Radiation Effects on Semiconductor Materials, Detectors and Devices, Florence, March 4-6 1998, Nucl. Instr. and Meth. A, in press.
    • (1998) Nucl. Instr. and Meth. A
    • Casse, G.1    Glaser, M.2    Grigoriev, E.3
  • 15
    • 85031633044 scopus 로고    scopus 로고
    • Radiation damage on p-type silicon detectors
    • Presented at the 2nd Int. Conf. on Radiation Effects on Semiconductor Materials, Detectors and Devices, Florence, March 4-6 in press
    • U. Biggeri, E. Borchi, M. Bruzzi, E. Catacchini, S. Lazanu, Z. Li, S. Pirollo, S. Sciortino, Radiation damage on p-type silicon detectors, Presented at the 2nd Int. Conf. on Radiation Effects on Semiconductor Materials, Detectors and Devices, Florence, March 4-6 1998, Nucl. Instr. and Meth. A, in press.
    • (1998) Nucl. Instr. and Meth. A
    • Biggeri, U.1    Borchi, E.2    Bruzzi, M.3    Catacchini, E.4    Lazanu, S.5    Li, Z.6    Pirollo, S.7    Sciortino, S.8
  • 17
    • 70350694764 scopus 로고    scopus 로고
    • Fluence normalisation based on the NIEL scaled hypothesis
    • DESY, Hamburg, February
    • A. Vasilescu, Fluence normalisation based on the NIEL scaled hypothesis, Presented at 3rd the ROSE workshop on radiation hardening on silicon detectors, DESY, Hamburg, February 1998; M.M. Angarano, Characteristics and SPICE simulation of a single side n + on n type Si strip detector before and after neutron irradiation, Presented at the same workshop.
    • (1998) 3rd the ROSE Workshop on Radiation Hardening on Silicon Detectors
    • Vasilescu, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.