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Volumn 33, Issue 4, 1999, Pages 457-460
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Conductivity relaxation in coated porous silicon after annealing
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0033114774
PISSN: 10637826
EISSN: None
Source Type: Journal
DOI: 10.1134/1.1187710 Document Type: Article |
Times cited : (14)
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References (11)
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