Ion scattering experiments on some common sulphide minerals using a dynamic SIMS instrument

Comptes Rendus de l'Academie de Sciences - Serie IIa: Sciences de la Terre et des Planetes

Volumn 328, Issue 5, 1999, Pages 309-314

  Pratt, Allen R ^a   Franzreb, Klaus ^a   McIntyre, N Stewart ^a  

^a UNIVERSITY OF WESTERN ONTARIO   (Canada)

Author keywords

Ion scattering; SIMS; Sulphide minerals

Indexed keywords

CRYSTAL CHEMISTRY; SCATTERING; SULFIDE;

EID: 0033104927     PISSN: 12518050     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1251-8050(99)80122-0     Document Type: Article

References (5)

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2. Franzreb K., Pratt A.R., Splinter S. and Van Der Heide P. 1998. On the identification of LEIS contributions observed in the ion kinetic energy distributions collected on a Cameca IMS-3f SIMS instrument, Surf. Interface Anal., in press
3. Franzreb K. and Van Der Heide P. 1998. Performing low-energy ion scattering experiments on a Cameca IMS-3f, in: Gillen G. and Lareau R. (Eds.), SIMS XI Conference Proceedings, John Wiley, Chichester, 743-746
4. Reed D.A. and Baker J.E. 1983. Use of ISS and doubly charged secondary ions to monitor surface composition during SIMS analyses, Nucl. Instrum. Meth., 218, 324-326
5. Wittmaack K. 1996. Mass resolved low-energy ion backscattering spectrometry a target-to-projectile mass ratios near unity, Surf. Sci., 345, 110-124