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Volumn 39, Issue 1, 1999, Pages 66-70

Phase-stepped deflectometry applied to shape measurement of bent plates

Author keywords

[No Author keywords available]

Indexed keywords

BENDING (DEFORMATION); COMPUTER SIMULATION; FINITE ELEMENT METHOD; MECHANICAL VARIABLES MEASUREMENT; SENSITIVITY ANALYSIS; STRUCTURAL ANALYSIS;

EID: 0033102377     PISSN: 00144851     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02329303     Document Type: Article
Times cited : (44)

References (13)
  • 1
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    • (1992) Optical Shop Testing , pp. 1
    • Mantravadi, M.V.1
  • 2
    • 0022677826 scopus 로고
    • Direct measurement of flexural strains in plates by shearography
    • J. Takezaki and Y. Y. Hung. Direct measurement of flexural strains in plates by shearography. Journal of Applied Mechanics, 53; 125-129, 1986.
    • (1986) Journal of Applied Mechanics , vol.53 , pp. 125-129
    • Takezaki, J.1    Hung, Y.Y.2
  • 3
    • 0022181598 scopus 로고
    • Direct determination of curvatures of bent plates using a double-glass-plate shearing interferometer
    • Dec.
    • G. Subramanian and S.M. Nair. Direct determination of curvatures of bent plates using a double-glass-plate shearing interferometer. EXPERIMENTAL MECHANICS, pages 376-380, Dec. 1985.
    • (1985) Experimental Mechanics , pp. 376-380
    • Subramanian, G.1    Nair, S.M.2
  • 4
    • 0039528364 scopus 로고
    • Flatness analysis of hard disks
    • O. Kafri and K. Kreske. Flatness analysis of hard disks. Optical Engineering, 27(10):878-882, 1988.
    • (1988) Optical Engineering , vol.27 , Issue.10 , pp. 878-882
    • Kafri, O.1    Kreske, K.2
  • 5
    • 84975609435 scopus 로고
    • High-sensitivity reflection-transmission moiré deflectometer
    • O. Kafri and L. Glatt. High-sensitivity reflection-transmission moiré deflectometer. Applied Optics, 27(2):351-353, 1988.
    • (1988) Applied Optics , vol.27 , Issue.2 , pp. 351-353
    • Kafri, O.1    Glatt, L.2
  • 6
    • 84975629340 scopus 로고
    • Moiré deflectometry with a focused beam: Radius of curvature, microscopy and thickness analysis
    • O. Kafri, E. Keren, K. Kreske, and Y. Zac. Moiré deflectometry with a focused beam: radius of curvature, microscopy and thickness analysis. Applied Optics, 29(1):133-136, 1990.
    • (1990) Applied Optics , vol.29 , Issue.1 , pp. 133-136
    • Kafri, O.1    Keren, E.2    Kreske, K.3    Zac, Y.4
  • 7
    • 84975646318 scopus 로고
    • Phase measuring ronchi test
    • K. Omura and T. Yatagai. Phase measuring Ronchi test. Applied Optics, 27(3):523-528, 1988.
    • (1988) Applied Optics , vol.27 , Issue.3 , pp. 523-528
    • Omura, K.1    Yatagai, T.2
  • 8
    • 84975622117 scopus 로고
    • Analysis of the interferometric Ronchi test
    • D. Malacara. Analysis of the interferometric Ronchi test. Applied Optics, 29(25):3633-3637, 1990.
    • (1990) Applied Optics , vol.29 , Issue.25 , pp. 3633-3637
    • Malacara, D.1
  • 9
    • 0018458311 scopus 로고
    • Slope and curvature measurement by a double-frequency-grating shearing interferometer
    • A. Assa, J. Politch, and A. A. Betser. Slope and curvature measurement by a double-frequency-grating shearing interferometer. EXPERIMENTAL MECHANICS, 19(4):129-137, 1979.
    • (1979) Experimental Mechanics , vol.19 , Issue.4 , pp. 129-137
    • Assa, A.1    Politch, J.2    Betser, A.A.3
  • 10
    • 0002128002 scopus 로고    scopus 로고
    • Design of algorithms for phase measurements by the use of phase stepping
    • Y. Surrel. Design of algorithms for phase measurements by the use of phase stepping. Applied Optics, 35(1):51-60, 1996.
    • (1996) Applied Optics , vol.35 , Issue.1 , pp. 51-60
    • Surrel, Y.1
  • 13
    • 0030296128 scopus 로고    scopus 로고
    • On the direct determination of invariant parameters governing anisotropic plate bending problems
    • M. Grédiac. On the direct determination of invariant parameters governing anisotropic plate bending problems. Journal of Solids and Structures, 33(27):3969-3982, 1996.
    • (1996) Journal of Solids and Structures , vol.33 , Issue.27 , pp. 3969-3982
    • Grédiac, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.