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Volumn 12, Issue 6, 1997, Pages 1640-1645

A high-resolution electron microscopy study of blue-light emitting β-SiC nanoparticles in C+-implanted silicon

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CARBON; CRYSTAL STRUCTURE; ELECTRON MICROSCOPY; ION IMPLANTATION; NANOSTRUCTURED MATERIALS; SILICON WAFERS; SINGLE CRYSTALS;

BLUE EMITTING EFFECTS; BLUE LIGHT EMITTING NANOPARTICLES; TRILAYERED STRUCTURE;

SILICON CARBIDE;

EID: 0031162738 PISSN: 08842914 EISSN: None Source Type: Journal
DOI: 10.1557/jmr.1997.0224 Document Type: Article

Times cited : (9)

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