Characterization of silicon microstrip detectors using an infrared laser system

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 423, Issue 2-3, 1999, Pages 303-319

  Abt, I ^a   Masciocchi, S ^a   Moshous, B ^a   Perschke, T ^a   Richter, R H ^a   Riechmann, K ^a   Wagner, W ^a  

^a MAX PLANCK INSTITUT FÜR PHYSIK   (Germany)

Author keywords

29.40.Gx; 29.40.Wk; Charge sharing; Depletion mapping; Infrared laser; Silicon microstrip detector

Indexed keywords

INFRARED RADIATION; LASER DIAGNOSTICS; MICROSTRIP DEVICES; READOUT SYSTEMS; SILICON SENSORS;

CHARGE SHARING; INFRARED LASERS; SILICON MICROSTRIP DETECTORS;

PARTICLE DETECTORS;

EID: 0033099304     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(98)01337-0     Document Type: Article

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