A 1060 nm diode laser system for dynamically probing silicon detectors

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 374, Issue 3, 1996, Pages 315-319

  Krizmanic, John ^a,b   Spangler, Jack ^a   Newman, Dave ^a   Orndorff, Joe ^a  

^a JOHNS HOPKINS UNIVERSITY   (United States)

^b NASA GODDARD SPACE FLIGHT CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LASER PULSES; MICROSTRIP DEVICES; OPTICAL FIBERS; READOUT SYSTEMS; SILICON SENSORS; TESTING; VOLTAGE MEASUREMENT;

NANOSECOND PULSES; SILICON MICROSTRIP DETECTORS; SINGLE MODE FIBER;

SEMICONDUCTOR LASERS;

EID: 0030166629     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-9002(96)00239-2     Document Type: Article

References (4)

1. See for example S.M. Sze, Physics of Semiconductor Devices, 2nd edition (Wiley-Interscience, 1981) p. 42.
2. E. Barberis et al., Proc. 7th Meeting of the American Physical Society Division of Particle and Fields, Vol 2 (1992) p. 1752.
3. S. Shaheen et al., Nucl. Instr. and Meth. A 352 (1995) 573.
4. J.F. Krizmanic, Nucl. Instr. and Meth. A 342 (1994) 27.