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Volumn 43, Issue 3, 1999, Pages 473-480
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A charge-control HEMT model incorporating deep level effects
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRON TRAPS;
SEMICONDUCTOR DEVICE MODELS;
SUBSTRATES;
VOLTAGE CONTROL;
DEEP LEVEL EFFECTS;
SELF-CONSISTENT CHARGE-CONTROL MODELS;
HIGH ELECTRON MOBILITY TRANSISTORS;
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EID: 0033099232
PISSN: 00381101
EISSN: None
Source Type: Journal
DOI: 10.1016/S0038-1101(98)00316-5 Document Type: Article |
Times cited : (2)
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References (30)
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