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Volumn 43, Issue 3, 1999, Pages 473-480

A charge-control HEMT model incorporating deep level effects

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON TRAPS; SEMICONDUCTOR DEVICE MODELS; SUBSTRATES; VOLTAGE CONTROL;

EID: 0033099232     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(98)00316-5     Document Type: Article
Times cited : (2)

References (30)
  • 18
    • 85034536693 scopus 로고
    • Ph.D. thesis, University of Leeds
    • Drury R. Ph.D. thesis, 1993, University of Leeds.
    • (1993)
    • Drury, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.