Growth analysis of electrodeposited CdS on ITO coated glass using atomic force microscopy

Physica Status Solidi (A) Applied Research

Volumn 172, Issue 1, 1999, Pages 137-147

  Rami, M ^a   Benamar, E ^a   Fahoume, M ^a   Ennaoui, A ^a,b  

^a FACULTÉ DES SCIENCES   (Morocco)

^b HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COATED MATERIALS; ELECTRODEPOSITION; ENERGY GAP; FILM GROWTH; MORPHOLOGY; OPTICAL PROPERTIES; POLYCRYSTALLINE MATERIALS; SEMICONDUCTING CADMIUM COMPOUNDS; SEMICONDUCTING GLASS; SEMICONDUCTING INDIUM COMPOUNDS; THIN FILMS;

CADMIUM SULFIDE; INDIUM TIN OXIDE;

SEMICONDUCTING FILMS;

EID: 0033096632     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-396X(199903)172:1<137::AID-PSSA137>3.0.CO;2-V     Document Type: Article

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