Angular dependence of the sputtering yield of rough beryllium surfaces

Journal of Nuclear Materials

Volumn 265, Issue 1-2, 1999, Pages 22-27

  Kustner M ^a   Eckstein, W ^a   Hechtl, E ^b   Roth, J ^a  

^a MAX PLANCK INSTITUT FÜR PLASMAPHYSIK   (Germany)

^b TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ION BOMBARDMENT; MONTE CARLO METHODS; RADIATION EFFECTS; SCANNING TUNNELING MICROSCOPY; SPUTTERING; SURFACE ROUGHNESS; TARGETS; TOKAMAK DEVICES;

PLASMA FACING MATERIALS;

BERYLLIUM;

EID: 0033080292     PISSN: 00223115     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3115(98)00648-5     Document Type: Article

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