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Volumn 12, Issue 1, 1999, Pages 129-138

Automatic generation of thin film process flows - Part II: Recipe generation, flow evaluation, and system framework

Author keywords

Process compilation; Process flow design; TCAD

Indexed keywords

ALGORITHMS; AUTOMATION; COMPUTATIONAL METHODS; COMPUTER AIDED NETWORK ANALYSIS; DATABASE SYSTEMS; ELECTRIC NETWORK SYNTHESIS; PARAMETER ESTIMATION; PROCESS ENGINEERING; THIN FILMS;

EID: 0033078112     PISSN: 08946507     EISSN: None     Source Type: Journal    
DOI: 10.1109/66.744534     Document Type: Review
Times cited : (10)

References (11)
  • 3
    • 0030708072 scopus 로고    scopus 로고
    • Multiple zone inverse diffusion solver for silicon processing
    • Boston, MA
    • Y. S. Wang and C. H. Mastrangelo, "Multiple zone inverse diffusion solver for silicon processing," in Tech. Dig., 1997 SISPAD Conf., Boston, MA, pp. 241-245, 1997.
    • (1997) Tech. Dig., 1997 SISPAD Conf. , pp. 241-245
    • Wang, Y.S.1    Mastrangelo, C.H.2
  • 7
    • 0025510962 scopus 로고
    • Statistical equipment modeling for VLSI manufacturing: An application for LPCVD
    • K. K. Lin and C. J. Spanos, "Statistical equipment modeling for VLSI manufacturing: An application for LPCVD," IEEE Trans. Semiconduct. Manufact., vol. 3, pp. 216-229, 1990.
    • (1990) IEEE Trans. Semiconduct. Manufact. , vol.3 , pp. 216-229
    • Lin, K.K.1    Spanos, C.J.2
  • 10
    • 0030647092 scopus 로고    scopus 로고
    • An experimental methodology for the estimation of spatially correlated parameteric yield in thin film devices
    • Boston, MA
    • E. T. Carlen and C. H. Mastrangelo, "An experimental methodology for the estimation of spatially correlated parameteric yield in thin film devices," in Tech. Dig., 1997 SISPAD Conf., Boston, MA, pp. 45-48, 1997.
    • (1997) Tech. Dig., 1997 SISPAD Conf. , pp. 45-48
    • Carlen, E.T.1    Mastrangelo, C.H.2
  • 11
    • 25144439773 scopus 로고    scopus 로고
    • Statistical multi-lot characterization of spatial thickness variations in LPCVD oxide, nitride, polysilicon, and thermal oxide films
    • Austin, TX
    • E. T. Carlen and C. H. Mastrangelo, "Statistical multi-lot characterization of spatial thickness variations in LPCVD oxide, nitride, polysilicon, and thermal oxide films," in Proc. SPIE Conf. Micro. Manuf., Austin, TX, pp. 27-39, 1997.
    • (1997) Proc. SPIE Conf. Micro. Manuf. , pp. 27-39
    • Carlen, E.T.1    Mastrangelo, C.H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.