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Volumn 6, Issue 1, 1999, Pages 1-10

Charge motion and trapping in insulators: Surface and bulk effects

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER MOBILITY; DATA REDUCTION; ELECTRIC CHARGE MEASUREMENT; ELECTRON TRAPS; IMPURITIES; IONIZATION;

EID: 0033077303     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/94.752003     Document Type: Article
Times cited : (51)

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