메뉴 건너뛰기




Volumn 209, Issue 1-2, 1997, Pages 328-337

Characterisation of surface roughness by laser light scattering: Specularly scattered intensity measurement

Author keywords

Light scattering; Roughness parameters; Surface roughness

Indexed keywords

CHARACTERIZATION; LASER BEAMS; LIGHT SCATTERING; STEEL; SURFACE ROUGHNESS; THREE DIMENSIONAL;

EID: 0031214994     PISSN: 00431648     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0043-1648(96)07497-2     Document Type: Article
Times cited : (13)

References (14)
  • 1
    • 0029276297 scopus 로고
    • An integrated approach to the characterization of surface wear, I: Qualitative characterization
    • W.P. Dong and K.J. Stout, An integrated approach to the characterization of surface wear, I: Qualitative characterization, Wear, 181-183 (1995) 700-16.
    • (1995) Wear , vol.181-183 , pp. 700-716
    • Dong, W.P.1    Stout, K.J.2
  • 2
    • 0029256257 scopus 로고
    • Surface topography evolution during sliding wear of 2009 Al-SiCp/17-4 PH
    • A.P. Sannino and H.J. Rack, Surface topography evolution during sliding wear of 2009 Al-SiCp/17-4 PH, Wear, 181-183 (1995) 202-11.
    • (1995) Wear , vol.181-183 , pp. 202-211
    • Sannino, A.P.1    Rack, H.J.2
  • 8
    • 0141725321 scopus 로고
    • Direct and inverse problems for light scattered by rough surfaces
    • E. Marx and T.V. Vorburger, Direct and inverse problems for light scattered by rough surfaces, Applied Optics, 29 (1990) 3613-26.
    • (1990) Applied Optics , vol.29 , pp. 3613-3626
    • Marx, E.1    Vorburger, T.V.2
  • 9
    • 0016981276 scopus 로고
    • Surface roughness measurements from coherent light scattering
    • P.J. Chandley, Surface roughness measurements from coherent light scattering, Optical and Quantum Electronics, 8 (1976) 323-327.
    • (1976) Optical and Quantum Electronics , vol.8 , pp. 323-327
    • Chandley, P.J.1
  • 10
    • 0020845366 scopus 로고
    • Surface roughness measurements of low-scatter mirrors and roughness standard
    • K.H. Guenther, P.G. Wierer and J.M. Benett, Surface roughness measurements of low-scatter mirrors and roughness standard, Applied Optics, 23 (1984) 3820-3834.
    • (1984) Applied Optics , vol.23 , pp. 3820-3834
    • Guenther, K.H.1    Wierer, P.G.2    Benett, J.M.3
  • 11
    • 0030103392 scopus 로고    scopus 로고
    • Influence of the surface height distribution on the total integrated scatter (TIS) formula
    • J.H. Rakels, Influence of the surface height distribution on the total integrated scatter (TIS) formula, Nanotechnology, 7 (1996) 43-46.
    • (1996) Nanotechnology , vol.7 , pp. 43-46
    • Rakels, J.H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.