-
1
-
-
0020845427
-
Microstructure of vapor-deposited optical coatings
-
K. H. Guenther, “Microstructure of vapor-deposited optical coatings,” Appl. Opt. 23, 3806-3916 (1984).
-
(1984)
Appl. Opt.
, vol.23
, pp. 3806-3916
-
-
Guenther, K.H.1
-
2
-
-
6144271331
-
-
(Elsevier, Amsterdam,), Chap. 8
-
H. K. Pulker, Coatings on Glasses (Elsevier, Amsterdam, 1984), Chap. 8, pp. 322-331.
-
(1984)
Coatings on Glasses
, pp. 322-331
-
-
Pulker, H.K.1
-
3
-
-
6144231701
-
Moisture-dependent anisotropic effects in optical coatings
-
J. R. Gee, L. J. Hodgkinson, and H. A. Macleod, “Moisture-dependent anisotropic effects in optical coatings,” Appl. Opt. 24, 3188-3192 (1985).
-
(1985)
Appl. Opt.
, vol.24
, pp. 3188-3192
-
-
Gee, J.R.1
Hodgkinson, L.J.2
Macleod, H.A.3
-
4
-
-
21144466082
-
Observation of oxygen enrichment in zirconium oxide films
-
E. E. Khawaja, F. Bouamrane, A. B. Hallak, M. A. Daous, and M. A. Salim, “Observation of oxygen enrichment in zirconium oxide films,” J. Vac. Sci. Technol. A 11, 580-587 (1993).
-
(1993)
J. Vac. Sci. Technol. A
, vol.11
, pp. 580-587
-
-
Khawaja, E.E.1
Bouamrane, F.2
Hallak, A.B.3
Daous, M.A.4
Salim, M.A.5
-
5
-
-
84914562083
-
Optical and crystalline inhomogeneity in evaporated zirconia films
-
R. E. Klinger and C. K. Carniglia, “Optical and crystalline inhomogeneity in evaporated zirconia films,” Appl. Opt. 24, 3184-3187 (1985).
-
(1985)
Appl. Opt.
, vol.24
, pp. 3184-3187
-
-
Klinger, R.E.1
Carniglia, C.K.2
-
6
-
-
0018204673
-
The relationship between optical inhomogeneity and film structure
-
M. Harris, H. A. Macleod, S. Ogura, E. Pelletier, and B. Vidal, “The relationship between optical inhomogeneity and film structure,” Thin Solid Films 57, 173-178 (1979).
-
(1979)
Thin Solid Films
, vol.57
, pp. 173-178
-
-
Harris, M.1
Macleod, H.A.2
Ogura, S.3
Pelletier, E.4
Vidal, B.5
-
7
-
-
84957490783
-
Properties of ion assisted deposited silica and titania films
-
R. I. Seddon, ed., Proc. SPIE 325
-
T. Allen, “Properties of ion assisted deposited silica and titania films,” in Optical Thin Films, R. I. Seddon, ed., Proc. SPIE 325, 93-100 (1982).
-
(1982)
Optical Thin Films
, pp. 93-100
-
-
Allen, T.1
-
8
-
-
0022519741
-
Ion-based methods for optical thin film deposition
-
P. J. Martin, “Ion-based methods for optical thin film deposition,” J. Mat. Sci. 21, 1-25 (1986).
-
(1986)
J. Mat. Sci.
, vol.21
, pp. 1-25
-
-
Martin, P.J.1
-
9
-
-
0003746634
-
Ion assisted Dielectric and optical coatings
-
J. J. Cuomo, S. M. Rossnagel, and H. R. Kaufman, eds. (Noyes, Park Ridge, N.J.,), Chap. 19
-
P. J. Martin and R. P. Netterfiled, “Ion assisted Dielectric and optical coatings,” in Handbook of Ion Beam Processing Technology, J. J. Cuomo, S. M. Rossnagel, and H. R. Kaufman, eds. (Noyes, Park Ridge, N.J., 1989), Chap. 19, pp. 373-414.
-
(1989)
Handbook of Ion Beam Processing Technology
, pp. 373-414
-
-
Martin, P.J.1
Netterfiled, R.P.2
-
10
-
-
36549100396
-
Model for ion-assisted thin-film densification
-
K. H. Mueller, “Model for ion-assisted thin-film densification,” J. Appl. Phys. 59, 2803-2907 (1986).
-
(1986)
J. Appl. Phys.
, vol.59
, pp. 2803-2907
-
-
Mueller, K.H.1
-
11
-
-
0001506662
-
Verification of momentum transfer as the dominant densifying mechanism in ion assisted deposition
-
J. D. Targove and H. A. Macleod, “Verification of momentum transfer as the dominant densifying mechanism in ion assisted deposition,” Appl. Opt. 27, 3779-3781 (1988).
-
(1988)
Appl. Opt.
, vol.27
, pp. 3779-3781
-
-
Targove, J.D.1
Macleod, H.A.2
-
12
-
-
84975551815
-
Ion assisted deposition of thermally evaporated Ag and Al films
-
C. K. Hwangbo, L. J. Lingg, J. P. Lehan, H. A. Macleod, J. L. Makous, and S. Y. Kim, “Ion assisted deposition of thermally evaporated Ag and Al films,” Appl. Opt. 28, 2769-2778 (1989).
-
(1989)
Appl. Opt.
, vol.28
, pp. 2769-2778
-
-
Hwangbo, C.K.1
Lingg, L.J.2
Lehan, J.P.3
Macleod, H.A.4
Makous, J.L.5
Kim, S.Y.6
-
13
-
-
84953681979
-
Intrinsic stress in sputtered thin films
-
H. Windischmann, “Intrinsic stress in sputtered thin films,” J. Vac. Sci. Technol. A 9, 2431-2436 (1991).
-
(1991)
J. Vac. Sci. Technol. A
, vol.9
, pp. 2431-2436
-
-
Windischmann, H.1
-
14
-
-
0026202438
-
Optical and microstructural properties of hafnium dioxide thin films
-
J. P. Lehan, Y. Mao, B. G. Bovard, and H. A. Macleod, “Optical and microstructural properties of hafnium dioxide thin films,” Thin Solid Films 203, 227-250 (1991).
-
(1991)
Thin Solid Films
, vol.203
, pp. 227-250
-
-
Lehan, J.P.1
Mao, Y.2
Bovard, B.G.3
Macleod, H.A.4
-
15
-
-
0021513002
-
Multiple determination of the optical constants of thin-film coating materials
-
D. P. Arndt, R. M. A. Azzam, J. M. Bennett, J. P. Borgogno, C. K. Carniglia, W. E. Case, J. A. Dobrowolski, U. J. Gibson, T. Tuttle Hart, F. C. Ho, V. A. Hodgkin, W. P. Klapp, H. A. Macleod, E. Pelletier, M. K. Purvis, D. M. Quinn, D. H. Strome, R. Swenson, P. A. Temple, and T. F. Thonn, “Multiple determination of the optical constants of thin-film coating materials,” Appl. Opt. 20, 3571-3596 (1984).
-
(1984)
Appl. Opt.
, vol.20
, pp. 3571-3596
-
-
Arndt, D.P.1
Azzam, R.M.A.2
Bennett, J.M.3
Borgogno, J.P.4
Carniglia, C.K.5
Case, W.E.6
Dobrowolski, J.A.7
Gibson, U.J.8
Tuttle Hart, T.9
Ho, F.C.10
Hodgkin, V.A.11
Klapp, W.P.12
Macleod, H.A.13
Pelletier, E.14
Purvis, M.K.15
Quinn, D.M.16
Strome, D.H.17
Swenson, R.18
Temple, P.A.19
Thonn, T.F.20
more..
-
16
-
-
0019648336
-
Microstructural information from optical properties in semiconductor technology
-
D. E. Aspnes, R. F. Potter, and S. S. So, eds., Proc. SPIE 276, see also references therein
-
D. E. Aspnes, “Microstructural information from optical properties in semiconductor technology,” in Optical Characterization Techniques for Semiconductor Technology, D. E. Aspnes, R. F. Potter, and S. S. So, eds., Proc. SPIE 276,188-195 (1981); see also references therein.
-
(1981)
Optical Characterization Techniques for Semiconductor Technology
, pp. 188-195
-
-
Aspnes, D.E.1
-
17
-
-
84975593962
-
Nondestructive depth profiling of ZnS and MgO films by spectroscopic ellipsometry
-
K. Vedam, S. Y. Kim, and L. D’Aries, “Nondestructive depth profiling of ZnS and MgO films by spectroscopic ellipsometry,” Opt. Lett. 12, 456-458 (1987).
-
(1987)
Opt. Lett.
, vol.12
, pp. 456-458
-
-
Vedam, K.1
Kim, S.Y.2
D’aries, L.3
-
18
-
-
0026980877
-
Microanalyses of Ar+-bombarded zirconia-yttria films on silicon substrates
-
+-bombarded zirconia-yttria films on silicon substrates,” Thin Solid Films 221, 9-12 (1988).
-
(1988)
Thin Solid Films
, vol.221
, pp. 9-12
-
-
Huang, N.K.1
Feng, Z.R.2
Wang, D.Z.3
-
19
-
-
0020174408
-
Refractive index of cubic zirconia stabilized with yttria
-
D. L. Wood and K. Nassau, “Refractive index of cubic zirconia stabilized with yttria,” Appl. Opt. 21, 2978-2981 (1982).
-
(1982)
Appl. Opt.
, vol.21
, pp. 2978-2981
-
-
Wood, D.L.1
Nassau, K.2
-
21
-
-
85010167164
-
-
International Center for Diffraction Data, 1601 Park Lane, Swarth-more, Pa., Chap. 1
-
Joint Committee on Powder Diffraction Standards, Powder Diffraction File Alphabetical Index Inorganic Phases (International Center for Diffraction Data, 1601 Park Lane, Swarth-more, Pa., 1986), Chap. 1, p. 550.
-
(1986)
Powder Diffraction File Alphabetical Index Inorganic Phases
, pp. 550
-
-
-
22
-
-
85010163804
-
-
2nd ed. (Wiley, New York,), Chap. 11
-
H. P. Klug and L. E. Alexander, X-Ray Diffraction Procedure, 2nd ed. (Wiley, New York, 1974), Chap. 11, pp. 757-764.
-
(1974)
X-Ray Diffraction Procedure
, pp. 757-764
-
-
Klug, H.P.1
Alexander, L.E.2
-
23
-
-
2242493734
-
-
(Interscience, New York,), Chap. 33
-
W. W. Kriegel and H. Palmour III, Mechanical Properties of Engineering Ceramics (Interscience, New York, 1961), Chap. 33, p. 583.
-
(1961)
Mechanical Properties of Engineering Ceramics
, pp. 583
-
-
Kriegel, W.W.1
Palmour, H.2
|