High-resolution synchrotron X-ray powder diffraction and Rietveld structure refinement of two (Mg0.95,Fe0.05)SiO3 perovskite samples synthesized under different oxygen fugacity conditions

American Mineralogist

Volumn 84, Issue 3, 1999, Pages 214-220

  Jephcoat, A P ^a   Hriljac, J A ^b   McCammon, C A ^c   O'Neill, H St C ^c   Rubie, D C ^c   Finger, L W ^d  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

^c UNIVERSITÄT BAYREUTH   (Germany)

^d Ctr High Pressure Res Geophys L   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION; MAGNESIUM COMPOUNDS; OXYGEN; PEROVSKITE; RIETVELD REFINEMENT; SILICATES; SILICON; X RAY POWDER DIFFRACTION; X RAYS;

ABSORPTION EDGES; MOSSBAUER STUDIES; MULTI-ANVIL PRESS; RIETVELD STRUCTURE REFINEMENT; SILICATE PEROVSKITE; STRUCTURAL EVIDENCE; STRUCTURAL REFINEMENT; SYNCHROTRON X RAY POWDER DIFFRACTION;

IRON COMPOUNDS;

CRYSTAL STRUCTURE; PEROVSKITE; X-RAY DIFFRACTION;

EID: 0033050906     PISSN: 0003004X     EISSN: None     Source Type: Journal    
DOI: 10.2138/am-1999-0301     Document Type: Article

References (23)

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