Optimum condition of convergent beam illumination for observation of local structure by high resolution transmission electron microscopy

Ultramicroscopy

Volumn 62, Issue 1-2, 1996, Pages 123-131

  Mitome, M ^a   Takayanagi, K ^b  

^a CANON INC   (Japan)

^b TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COHERENT LIGHT; ELECTRON LENSES; IMAGING TECHNIQUES; INTERFACES (MATERIALS); LIGHT INTERFERENCE; OSCILLATIONS; PARTICLES (PARTICULATE MATTER); SURFACES;

CONVERGENT BEAM ILLUMINATION; CRYSTAL PERIODICITY; NON PERIODIC LOCAL STRUCTURES;

TRANSMISSION ELECTRON MICROSCOPY;

ARTICLE; ELECTRON MICROSCOPY; ILLUMINATION; METHODOLOGY; STRUCTURE ANALYSIS;

EID: 0029931596     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/0304-3991(95)00139-5     Document Type: Article

References (14)

1. Y. Matsui, S. Horiuchi, Y. Bando, Y. Kitami, M. Yokoyama, S. Suehara, I. Matsui and T. Katsuta, Jpn. J. Appl. Phys. 30 (1991) L64.
2. L.D. Marks, Surf. Sci. 139 (1984) 281.
3. N. Ikarashi, K. Kobayashi, H. Koike, H. Hasegawa and K. Yagi, Ultramicroscopy 26 (1988) 195.
4. J.M. Gibson, M.L. McDonald, J.L. Batstone and J.M. Phillips, Ultramicroscopy 22 (1987) 35.
5. S. Takeda, Jpn. J. Appl. Phys. 30 (1991) L639.
6. S. Iijima and T. Ichihashi, Phys. Rev. Lett. 56 (1986) 616.
7. M. Mitome, Y. Tanishiro and K. Takayanagi, Z. Phys. D 12 (1989) 45.
8. M. Mitome, K. Takayanagi and Y. Tanishiro, Ultramicroscopy 33 (1990) 255.
9. J. Frank, Optik 38 (1973) 519.
10. J.M. Cowley, Diffraction Physics (North-Holland, Amsterdam, 1975).
11. C.B. Eisenhandler and B.M. Siegel, J. Appl. Phys. 37 (1966) 1613.
12. J.M. Cowley and A.F. Moodie, Acta Cryst. 10 (1957) 609.
13. M. Born and E. Wolf, Principles of Optics (Pergamon, Oxford, 1964).
14. F. Nagata, T. Matsuda and T. Komoda, Jpn. J. Appl. Phys. 14 (1975) 1815.