Crystallographic origin of the alternate bright/dark contrast in 6H-SiC and other hexagonal crystal HREM images

Microscopy and Microanalysis

Volumn 2, Issue 2, 1996, Pages 63-78

  Bow, J S ^a,b   Carpenter, R W ^a,c   Kim, M J ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

^b INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE   (Taiwan)

^c and Mat Eng Department

Author keywords

Hexagonal crystals; High resolution transmission electron microscopy; Silicon Carbide

Indexed keywords

EID: 17044376748     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927696210633     Document Type: Article

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