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Optik (Jena)
Volumn 107, Issue 2, 1997, Pages 67-72
High-resolution spherical-aberration-free phase imaging by defocus image modulation processing under hollow-cone illumination: Experimental confirmation by optical microscopy
Author keywords

[No Author keywords available]
Indexed keywords

ABERRATIONS; ELECTRON MICROSCOPES; FUNCTIONS; IMAGE PROCESSING; MATHEMATICAL MODELS; OPTICAL MICROSCOPY; OPTICAL RESOLVING POWER;
EID: 0031378518     PISSN: 00304026     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (3)
References (9)
  • 1
    • 0017209565 scopus 로고
    • A method for producting hollow-cone illumination electronically in the conventional transmission microscope
    • W Krakow, L. A. Howland: A method for producting hollow-cone illumination electronically in the conventional transmission microscope. Ultramicroscopy 2 (1976) 53-67.
    • (1976) Ultramicroscopy , vol.2 , pp. 53-67
    • Krakow, W.1    Howland, L.A.2
  • 2
    • 0021786910 scopus 로고
    • Apopdization in phase-contrast electron microscopy realized with hollow-cone illumination
    • W. Kunath, F. Zemlin, K. Weiss: Apopdization in phase-contrast electron microscopy realized with hollow-cone illumination. Ultramicroscopy 16 (1985) 123-138.
    • (1985) Ultramicroscopy , vol.16 , pp. 123-138
    • Kunath, W.1    Zemlin, F.2    Weiss, K.3
  • 3
    • 0030968518 scopus 로고    scopus 로고
    • Multiple beam tilt microscopy for super resolved imaging
    • A.I. Kirkland, W.O. Saxton, G. Chand: Multiple beam tilt microscopy for super resolved imaging. J. Electron Microsc. 46 (1997) 11-22.
    • (1997) J. Electron Microsc. , vol.46 , pp. 11-22
    • Kirkland, A.I.1    Saxton, W.O.2    Chand, G.3
  • 5
    • 0011794004 scopus 로고
    • Spherical aberration-free imaging bv hollow cone illumination processed by the focal-depth extension method
    • Paris
    • Y. Takai, N. Oba, T. Ando, T. Ikuta, R. Shimizu: Spherical aberration-free imaging bv hollow cone illumination processed by the focal-depth extension method. Proc. 13th Int. Cong. Electron Microsc., Paris 1 (1994) 153-154.
    • (1994) Proc. 13th Int. Cong. Electron Microsc. , vol.1 , pp. 153-154
    • Takai, Y.1    Oba, N.2    Ando, T.3    Ikuta, T.4    Shimizu, R.5
  • 6
    • 0024951939 scopus 로고
    • Image restoration in coherent imaging system involving spherical aberration
    • T. Ikuta: Image restoration in coherent imaging system involving spherical aberration. J. Electron Microsc. 38 (1989) 415-422.
    • (1989) J. Electron Microsc. , vol.38 , pp. 415-422
    • Ikuta, T.1
  • 7
    • 0028448801 scopus 로고
    • Development of real-time defocus-modulalion-type active image processing (DMAIP) for spherical-aherration-free TEM observation
    • T. Ando, Y. Taniguchi, Y. Takai, Y. Kimura, T. Ikuta, R. Shimizu: Development of real-time defocus-modulalion-type active image processing (DMAIP) for spherical-aherration-free TEM observation. Ultramicroscopy 54 (1994) 261-267.
    • (1994) Ultramicroscopy , vol.54 , pp. 261-267
    • Ando, T.1    Taniguchi, Y.2    Takai, Y.3    Kimura, Y.4    Ikuta, T.5    Shimizu, R.6
  • 8
    • 0002197260 scopus 로고
    • Correction of spherical aberration in hrem image using defocus-modulation image processing
    • Y. Taniguchi, Y. Takai, T. Ikuta, R. Shimizu: Correction of spherical aberration in hrem image using defocus-modulation image processing. J. Electron Microsc. 41 (1992) 21-29.
    • (1992) J. Electron Microsc. , vol.41 , pp. 21-29
    • Taniguchi, Y.1    Takai, Y.2    Ikuta, T.3    Shimizu, R.4

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.