Multiphase analysis with EDX elemental maps: Software implementation and application to (Bi,Pb)2Sr2Ca2Cu3O(10+δ) high-T(c) superconducting tapes

Micron

Volumn 30, Issue 1, 1999, Pages 85-97

  Kenda, A ^a,b   Eibl, O ^a   Pongratz, P ^b  

^a SIEMENS AG   (Germany)

^b VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

B(i)(Pb) 2223 tapes; Concentration histogram image; EDX mapping; EDX spectroscopy; High temperature superconductors; Image processing; Phase analysis; Scripts

Indexed keywords

EID: 0032987664     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0968-4328(98)00033-X     Document Type: Article

References (11)

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11. Wu L.J., Wang Y.-L., Zhu Y., Thurston T.R., Sabatini R.L., Haldar P., Suenaga M. Kinetic of the alignment and the formation of the Bi(2223) platelets in powder-in-tube processed Bi(2223)/Ag composite tapes. J. Mater. Res. 12:1997;3055-3073.