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Volumn 13, Issue 19, 1999, Pages 1917-1923

Evidence of simple intramolecular rearrangement at polymer end groups in secondary ion mass spectrometry

Author keywords

[No Author keywords available]

Indexed keywords

MOLECULAR STRUCTURE; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY; SILICON COMPOUNDS;

EID: 0032880346     PISSN: 09514198     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1097-0231(19991015)13:19<1917::AID-RCM733>3.0.CO;2-P     Document Type: Article
Times cited : (6)

References (38)
  • 14
    • 85159502004 scopus 로고    scopus 로고
    • Clarke DR, Suresh S, Ward IM. (eds). Cambridge University Press: Cambridge
    • Briggs D. In Surface Analysis of Polymers by XPS and Static SIMS, Clarke DR, Suresh S, Ward IM. (eds). Cambridge University Press: Cambridge, 1998; 142.
    • (1998) Surface Analysis of Polymers by XPS and Static SIMS , pp. 142
    • Briggs, D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.