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Volumn 196, Issue 1, 1999, Pages 62-66

Finite element analysis of dislocation density during bulk single crystal growth (effect of doping atoms in InP single crystal)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CREEP; DISLOCATIONS (CRYSTALS); ENCAPSULATION; FINITE ELEMENT METHOD; MATHEMATICAL MODELS; SEMICONDUCTING INDIUM PHOSPHIDE; SEMICONDUCTOR DOPING; SINGLE CRYSTALS; STRAIN RATE;

EID: 0032785163     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(98)00775-1     Document Type: Article
Times cited : (12)

References (10)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.