메뉴 건너뛰기




Volumn 86, Issue 1, 1999, Pages 23-33

Efficient fault diagnosis of large scale analogue circuits based on symbolic method

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; BENCHMARKING; ELECTRIC FAULT CURRENTS; ELECTRIC NETWORK ANALYSIS; ELECTRIC NETWORK SYNTHESIS; FAILURE ANALYSIS; OPTIMIZATION; SENSITIVITY ANALYSIS;

EID: 0032762917     PISSN: 00207217     EISSN: 13623060     Source Type: Journal    
DOI: 10.1080/002072199133643     Document Type: Article
Times cited : (2)

References (18)
  • 1
    • 0022107260 scopus 로고
    • Fault diagnosis of analog circuits
    • Bandler, J. W, and Salama, A. E., 1985, Fault diagnosis of analog circuits. IEEE Proceedings, 73, (8), 1279-1325.
    • (1985) IEEE Proceedings , vol.73 , Issue.8 , pp. 1279-1325
    • Bandler, J.W.1    Salama, A.E.2
  • 3
    • 0024902763 scopus 로고    scopus 로고
    • Fast large change sensitivity analysis for circuit simulation
    • Divekar, D., Daseking, H., and Apte, R., 1998, Fast large change sensitivity analysis for circuit simulation. IEEE ISCAS’89, pp. 2020-2022.
    • (1998) IEEE ISCAS , vol.89 , pp. 2020-2022
    • Divekar, D.1    Daseking, H.2    Apte, R.3
  • 11
    • 0026895778 scopus 로고
    • An unified decomposition approach for fault location in switched capacitor circuits
    • Salama, A. E., and Amer, F. Z., 1992, An unified decomposition approach for fault location in switched capacitor circuits. International Journal of Electronics, 73, (1), 85-100.
    • (1992) International Journal of Electronics , vol.73 , Issue.1 , pp. 85-100
    • Salama, A.E.1    Amer, F.Z.2
  • 16
    • 0030420223 scopus 로고    scopus 로고
    • Efficient multifrequency analysis of fault diagnosis in analog circuits based on large change sensitivity computation
    • Wei, T, Wong, W.T, and Lee, Y. S., 1996, Efficient multifrequency analysis of fault diagnosis in analog circuits based on large change sensitivity computation. Proceedings of the Fifth Asian Test Symposium, Taiwan, pp. 232-237.
    • (1996) Proceedings of the Fifth Asian Test Symposium, Taiwan , pp. 232-237
    • Wei, T.1    Wong, W.T.2    Lee, Y.S.3
  • 18
    • 0029251398 scopus 로고
    • Analog system-level fault diagnosis based on a symbolic method in the frequency domain
    • You, Z. H., Sinencio, E. s., and Gyvez, J. P., 1995, Analog system-level fault diagnosis based on a symbolic method in the frequency domain. IEEE Transactions on Instrument and Measurement, 44, 28-35.
    • (1995) IEEE Transactions on Instrument and Measurement , vol.44 , pp. 28-35
    • You, Z.H.1    Sinencio, E.S.2    Gyvez, J.P.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.