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Volumn , Issue , 1996, Pages 232-237

Efficient multifrequency analysis of fault diagnosis in analog circuits based on large change sensitivity computation

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; COMPUTER SIMULATION; ELECTRIC FAULT CURRENTS; ELECTRIC NETWORK PARAMETERS; MATHEMATICAL MODELS; SENSITIVITY ANALYSIS; VLSI CIRCUITS;

EID: 0030420223     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (12)

References (10)
  • 4
    • 0022107260 scopus 로고
    • Fault diagnosis of analog circuits
    • Aug
    • J.W. Bandler, A.E. Salama, Fault Diagnosis of Analog Circuits, Proc. IEEE, vol. 73, No. 8, Aug. 1985, pp. 1279-1325
    • (1985) Proc. IEEE , vol.73 , Issue.8 , pp. 1279-1325
    • Bandler, J.W.1    Salama, A.E.2
  • 6
    • 0002621116 scopus 로고
    • An intergrated approach for analog circuit testing with a minimum number of detected parameter
    • IEEE CS Press
    • M.Slamani, B.Kaminska, G.Quesnel, An Intergrated Approach for Analog Circuit Testing with a Minimum Number of Detected Parameter, Proc. Int'l Test Conf., IEEE CS Press, 1994, pp. 631-640
    • (1994) Proc. Int'l Test Conf , pp. 631-640
    • Slamani, M.1    Kaminska, B.2    Quesnel, G.3
  • 7
    • 0029251398 scopus 로고
    • Analog system-level fault diagnosis based on a symbolic method in the frequency domain
    • Feb
    • Zhihong You, E.Sanchez Sinencio and J.P. de Gyvez, Analog System-level Fault Diagnosis based on a Symbolic Method in the Frequency Domain, IEEE Trans. Instrum. Meas., vol. 44, No. l.Feb. 1995, pp. 28-35
    • (1995) IEEE Trans. Instrum. Meas , vol.44 , Issue.1 , pp. 28-35
    • You, Z.1    Sinencio E.Sanchez2    De Gyvez, J.P.3
  • 9
    • 0015482406 scopus 로고
    • Differential-incremental sensitivity relationships
    • Dec
    • J.K. Fidler, Differential-Incremental Sensitivity Relationships, Electronics Letters, vol. 8, No. 25, Dec. 1972, pp. 626-627
    • (1972) Electronics Letters , vol.8 , Issue.25 , pp. 626-627
    • Fidler, J.K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.