Effects of Fast Secondary Electrons on Spatiallyresolved Low-Loss Eels of Polystyrene

Microscopy and Microanalysis

Volumn 4, Issue 2 S, 1998, Pages 804-805

  Siangchaew, K ^a   Libera, M ^a  

^a Stevens Institute of Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 22444455745     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927600024144     Document Type: Conference Paper

References (8)

1. J.J. Ritsko, Electronic Properties of Polymers, ed. J. Mort et al., Wiley, N.Y. 1982
2. A. Charlesby, Atomic Radiation and Polymers, Pergamon Press, N.Y., 1960
3. L. Reimer, Transmission Electron Microscopy 3rd ed., Springer-Verlag, N.Y., 1993
4. D. Newbury etal., Advanced Scanning Electron Microscopy , Plenum, N.Y., 1986
5. M. Isaacson, in Principles and Techniques of Electron Microscopy, V7, ed. M. Hayat (Van Nostrand Reinhold, N . Y ) pp. 1-78
6. K. Murata,, D. Kyser, and C. Ting, J. Applied Physics 52, 4396, 1981
7. J. Hunt, M. Disko, S. Behal, and R. Leapman, Ultramicroscopy 58, 55-64, 1995
8. Supported by the Army Research Office: DAAG55-97-1-0137 & DAAH04-93-G-0239